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1.	Image from Amazon.com Image from Coce	Nonvolatile memory technologies with emphasis on flash : a comprehensive guide to understanding and using NVM devices by Brewer, Joe E Gill, Manzur Series: IEEE Press series on microelectronic systems Material type: Text Publication details: New Jersey IEEE Press & John Wiley 2008 Availability: Items available for loan: LRC, IIT Indore (6)Call number: 621.39732 BRE, ... Items available for reference: LRC, IIT Indore: Not For Loan (2)Call number: 621.39732 BRE, ... Place hold
2.	Image from Amazon.com Image from Coce	Reliability wearout mechanisms in advanced CMOS technologies by Strong, Alvin W...[et al.] Series: IEEE Press series on microelectronic systems Material type: Text Publication details: New Jersey John Wiley & Sons 2009 Availability: Items available for loan: LRC, IIT Indore (3)Call number: 621.381 STR, ... Items available for reference: LRC, IIT Indore: Not For Loan (1)Call number: 621.381 STR. Place hold
3.	Image from Amazon.com Image from Coce	Understanding delta-sigma data converters [2nd ed.] by Pavan, Shanthi Schreier, Richard Temes, Gabor C Series: IEEE press series on microelectronic systems Edition: 2nd ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Hoboken John Wiley and Sons 2017 Availability: Items available for loan: LRC, IIT Indore (1)Call number: 621.38159 PAV.2E. Place hold

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