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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

By:

Pavlov, Andrei

Contributor(s):

Sachdev, Manoj

Material type: Text

Text

TextPublication details: New Delhi Springer 2011Description: xvi, 193 p. ; 23.5 cmISBN:

9788132202325

Subject(s):

Computer sc. /Electrical engg

DDC classification:

621.38152 PAV

Item type:

Book

Holdings ( 1 )

Holdings
Item type	Home library	Call number	Status	Barcode
Book	LRC, IIT Indore 2nd Floor - General Stack	621.38152 PAV (Browse shelf(Opens below))	Available	16049

Total holds: 0

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Previous	621.38152 OHR.2E Materials science of thin films : deposition and structure [2nd ed.]	621.38152 OHR.2E Materials science of thin films : deposition and structure [2nd ed.]	621.38152 PAV CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test	621.38152 PAV CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test	621.38152 RUB Interface controlled organic thin films	621.38152 SAL Conjugated polymer surfaces : electronic and chemical structure of interfaces for polymer light emitting devices	621.38152 SAL Conjugated polymer surfaces : electronic and chemical structure of interfaces for polymer light emitting devices	Next

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