CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test (Record no. 16049)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00503nam a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 170106s2011||||xx |||||||||||||| ||und|| |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9788132202325 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Item number | PAV |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Pavlov, Andrei |
| 245 #0 - TITLE STATEMENT | |
| Title | CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | New Delhi |
| Name of publisher, distributor, etc. | Springer |
| Date of publication, distribution, etc. | 2011 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xvi, 193 p. ; 23.5 cm |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Computer sc. /Electrical engg. |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Sachdev, Manoj |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Book |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Total Checkouts | Total Renewals | Full call number | Barcode | Date last seen | Date last checked out | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| LRC, IIT Indore | LRC, IIT Indore | 2nd Floor - General Stack | 23/08/2012 | PO No. 140 ; Vendor: ABI ; Bill No. ABI 22950, dt.17.08.2012; Price: INR | 3 | 5 | 621.38152 PAV | 16049 | 15/05/2024 | 08/04/2024 | 23/08/2012 | Book |
