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विद्यार्जन
 संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
Learning Resource Center, Indian Institute of Technology Indore

ऑनलाइन सार्वजनिक अभिगम प्रसूची
Online Public Access Catalogue (OPAC)

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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

By: Contributor(s): Material type: TextTextPublication details: New Delhi Springer 2011Description: xvi, 193 p. ; 23.5 cmISBN:
  • 9788132202325
Subject(s): DDC classification:
  • 621.38152 PAV
Item type: Book
Holdings
Item type Home library Call number Status Barcode
Book Book LRC, IIT Indore 2nd Floor - General Stack 621.38152 PAV (Browse shelf(Opens below)) Available 16049
Total holds: 0
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