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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

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Material type: Text

TextPublication details: New York Springer 2008Description: xii, 405 p. ; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Books	LRC, IIT Indore 3rd Floor - Reference Collection	Reference	620.5 TEH (Browse shelf(Opens below))	Not For Loan		9287

Total holds: 0

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