Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
Tehranipoor, Mohammad
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - New York Springer 2008 - xii, 405 p. ; 24 cm
9780387747460
Engineering
620.5 / TEH
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - New York Springer 2008 - xii, 405 p. ; 24 cm
9780387747460
Engineering
620.5 / TEH