| 000 | 00877nam a22002537a 4500 | ||
|---|---|---|---|
| 999 |
_c45048 _d45048 |
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| 005 | 20200213161437.0 | ||
| 008 | 200213b2019 xxu||||| |||| 00| 0 eng d | ||
| 020 |
_a9789813297661 _qpbk |
||
| 082 |
_a621.395 _bSEN |
||
| 100 | _aSengupta, Anirban | ||
| 245 | _aVLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019 : revised selected papers | ||
| 260 |
_aSingapore _bSpringer Nature _c2019 |
||
| 300 | _axvi, 775p. ; 24 cm. | ||
| 440 |
_aCommunications in computer and information science _vvol.1066 |
||
| 650 | _aIntegrated circuits | ||
| 650 | _aVery large scale integration - Dsign and construction | ||
| 650 | _aVery large scale integration - Testing | ||
| 650 | _aVLSI | ||
| 700 | _aDasgupta, Sudeb | ||
| 700 | _aSingh, Virendra | ||
| 700 | _aSharma, Rohit | ||
| 700 | _aVishvakarma, Santosh Kumar | ||
| 942 |
_2ddc _cBK |
||