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	1.		Image from Amazon.com Image from Coce	Defects in Microelectronic Materials and Devices by Fleetwood, Daniel M Pantelides, Sokrates T Schrimpf, Ronald D Material type: Text Publication details: Boca Raton CRC Press 2009 Availability: Items available for reference: LRC, IIT Indore: Not For Loan (1)Call number: 621.381FLE.
	2.		Image from Amazon.com Image from Coce	Defects in Microelectronic Materials and Devices by Fleetwood, Daniel M Pantelides, Sokrates T Schrimpf, Ronald D Material type: Text Publication details: Boca Raton CRC Press 2009 Availability: Items available for reference: LRC, IIT Indore: Not For Loan (1)Call number: 621.381 FLE.
	3.		Image from Amazon.com Image from Coce	Defects in Microelectronic Materials and Devices by Fleetwood, Daniel M Pantelides, Sokrates T Schrimpf, Ronald D Material type: Text Publication details: Boca Raton CRC Press 2009 Availability: Items available for loan: LRC, IIT Indore (1)Call number: 621.381 FLE. Place hold
	4.		Image from Amazon.com Image from Coce	Defects in Microelectronic Materials and Devices by Fleetwood, Daniel M Pantelides, Sokrates T Schrimpf, Ronald D Material type: Text Publication details: Boca Raton CRC Press 2009 Availability: Items available for loan: LRC, IIT Indore (1)Call number: 621.381 FLE. Place hold
	5.		Image from Amazon.com Image from Coce	Defects in Microelectronic Materials and Devices by Fleetwood, Daniel M Pantelides, Sokrates T Schrimpf, Ronald D Material type: Text Publication details: Boca Raton CRC Press 2009 Availability: Items available for loan: LRC, IIT Indore (1)Call number: 621.381 FLE. Place hold

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