TY  - BOOK
AU  - Strong, Alvin W...[et al.]
TI  - Reliability wearout mechanisms in advanced CMOS technologies 
SN  - 9780471731726
U1  - 621.381 
PY  - 2009///
CY  - New Jersey
PB  - John Wiley & Sons
KW  - Electrical Engg
ER  -