TY  - BOOK
AU  - Friedman, A.
TI  - Digital Systems Testing and Testable Design: 
SN  - 9780470544389
PB  - Wiley-IEEE Press
KW  - Components, Circuits, Devices & Systems
N1  - Book ID : 5266057
UR  - http://ieeexplore.ieee.org/servlet/opac?bknumber=5266057
ER  -