TY  - BOOK
AU  - Pavlov, Andrei
AU  - Sachdev, Manoj
TI  - CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test
SN  - 9788132202325
U1  - 621.38152 
PY  - 2011///
CY  - New Delhi
PB  - Springer
KW  - Computer sc. /Electrical engg
ER  -