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Reliability wearout mechanisms in advanced CMOS technologies

By:

Strong, Alvin W...[et al.]

Material type: Text

Text

TextSeries: IEEE Press series on microelectronic systemsPublication details: New Jersey John Wiley & Sons 2009Description: xv, 624 p. ; 24 cmISBN:

9780471731726

Subject(s):

Electrical Engg

DDC classification:

621.381 STR

Item type:

Book

Holdings ( 4 )

Holdings
Item type	Home library	Collection	Call number	Status	Barcode
Text/Reserve Book	LRC, IIT Indore 2nd Floor - Textbook Reserve	Non-fiction	621.381 STR (Browse shelf(Opens below))	Not For Loan	23026
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23027
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23028
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23029

Total holds: 0

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Previous	621.381 SO Organic electronics : materials, processing, devices and applications	621.381 SO Organic electronics : materials, processing, devices and applications	621.381 STR Reliability wearout mechanisms in advanced CMOS technologies	621.381 STR Reliability wearout mechanisms in advanced CMOS technologies	621.381 STR Reliability wearout mechanisms in advanced CMOS technologies	621.381 TAU Digital integrated electronics	621.381 TAU Digital integrated electronics	Next

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