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विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
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Atomic force microscopy : understanding basic modes and advanced applications

By: Material type: TextTextPublication details: Hoboken, New Jersey John Wiley and Sons 2012Description: xxii, 464p. ; 24 cmISBN:
  • 9780470638828
Subject(s): DDC classification:
  • 620.5 HAU
Item type: Book
Holdings
Item type Home library Collection Call number Status Date due Barcode
Reference Books Reference Books LRC, IIT Indore 3rd Floor - Reference Collection Reference 620.5 HAU (Browse shelf(Opens below)) Checked out to Pravarthana Dhanapal (I2204198) Not For Loan 30/10/2025 24586
Total holds: 0
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