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Reliability wearout mechanisms in advanced CMOS technologies

By:

Strong, Alvin W...[et al.]

Material type: Text

Text

TextSeries: IEEE Press series on microelectronic systemsPublication details: New Jersey John Wiley & Sons 2009Description: xv, 624 p. ; 24 cmISBN:

9780471731726

Subject(s):

Electrical Engg

DDC classification:

621.381 STR

Item type:

Book

Holdings ( 4 )

Holdings
Item type	Home library	Collection	Call number	Status	Barcode
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23027
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23028
Book	LRC, IIT Indore 2nd Floor - General Stack		621.381 STR (Browse shelf(Opens below))	Available	23029
Text/Reserve Book	LRC, IIT Indore 2nd Floor - Textbook Reserve	Non-fiction	621.381 STR (Browse shelf(Opens below))	Not For Loan	23026

Total holds: 0

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