000 00430nam a2200157Ia 4500
008 170106s2010||||xx |||||||||||||| ||und||
020 _a9783527323500
082 _a543
_bPIE
100 _aPierce, David T
245 0 _aTrace Analysis with Nanomaterials
260 _aWeinheim
_bWiley-VCH Verlag GmbH & Co. KGaA
_c2010
300 _axxi, 396 p. ; 24 cm
650 _aEngineering
700 _a Zhao, Julia Xiaojun
942 _cBK
999 _c9684
_d9684