000 00430nam a2200157Ia 4500
005 20240322183224.0
008 170106s2010||||xx |||||||||||||| ||und||
020 _a9780080964546
082 _a620.50287
_bLEA
100 _aLeach, Richard K.
245 0 _aFundamental principles of engineering nanometrology
260 _aAmsterdam
_bElsevier
_c2010
300 _axxvi, 321p. ; 24cm.
653 _aNanometrology
942 _cBK
_2ddc
999 _c9484
_d9484