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विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by
Material type: Text Text
Publication details: New Delhi Springer 2011
Availability: Items available for loan: LRC, IIT Indore (1)Location, call number: 2nd Floor - General Stack 621.38152 PAV.

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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by
Material type: Text Text
Publication details: New Delhi Springer 2011
Availability: Not available: LRC, IIT Indore: Checked out (1).

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