Reliability wearout mechanisms in advanced CMOS technologies
Material type: TextSeries: IEEE Press series on microelectronic systemsPublication details: New Jersey John Wiley & Sons 2009Description: xv, 624 p. ; 24 cmISBN:- 9780471731726
- 621.381 STR
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Text/Reserve Book | LRC, IIT Indore 2nd Floor - Textbook Reserve | Non-fiction | 621.381 STR (Browse shelf(Opens below)) | Not For Loan | 23026 | ||
Book | LRC, IIT Indore 2nd Floor - General Stack | 621.381 STR (Browse shelf(Opens below)) | Available | 23027 | |||
Book | LRC, IIT Indore 2nd Floor - General Stack | 621.381 STR (Browse shelf(Opens below)) | Available | 23028 | |||
Book | LRC, IIT Indore 2nd Floor - General Stack | 621.381 STR (Browse shelf(Opens below)) | Available | 23029 |
Total holds: 0