TY  - BOOK
AU  - Goodhew, Peter J
AU  - Beanland
AU  - Humphrey, John
AU  - Richard
TI  - Electron microscopy and analysis
SN  - 0748409688
U1  - 502.825 
PY  - 2001///
CY  - London
PB  - Taylor & Francis
KW  - Materials Sc. Engg
ER  -