TY  - BOOK
AU  - Bonani, Fabrizio 
AU  -  Ghione, Giovanni
TI  - Noise in semiconductor devices : modeling and simulation
SN  - 3540665838 
U1  - 621.36 
PY  - 2001///
CY  - Berlin
PB  - Springer-Verlag
KW  - Electrical engineering
ER  -