Strong, Alvin W...[et al.] <br/><br/>
Reliability wearout mechanisms in advanced CMOS technologies  

 - New Jersey  John Wiley & Sons  2009 
 - xv, 624 p. ; 24 cm 
 - IEEE Press series on microelectronic systems .
<br/><br/><label>ISBN: </label>9780471731726 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical Engg.
<br/><br/><label>Dewey Class. No.: </label>621.381  / STR