Pierce, David T  <br/><br/>
Trace Analysis with Nanomaterials 

 - Weinheim  Wiley-VCH Verlag GmbH & Co. KGaA  2010 
 - xxi, 396 p. ; 24 cm 
<br/><br/><label>ISBN: </label>9783527323500 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering
<br/><br/><label>Dewey Class. No.: </label>543  / PIE