TY  - BOOK
AU  - Fleetwood, Daniel M 
AU  -  Pantelides, Sokrates T 
AU  -  Schrimpf, Ronald D 
TI  - Defects in Microelectronic Materials and Devices
SN  - 9781420043761
U1  - 621.381FLE 
PY  - 2009///
CY  - Boca Raton
PB  - CRC Press
KW  - Electrical Engineering
ER  -