Wunderlich, Hans-Joachim  <br/><br/>
Models in hardware testing : lecture notes of the forum in honor of Christian Landrault 

 - New York  Springer  2010 
 - xiv, 257p. ; 24cm. 
 - Frontiers in electronic testing ; v. 43 .
<br/><br/><label>ISBN: </label>9789048132812 
<br/><br/><label>Dewey Class. No.: </label>621.38215  / WUN