Birkholz, Mario <br/><br/>
Thin film analysis by X-Ray scattering 

 - Weinheim  WILEY-VCH  2006 
 - xxii, 356p. ; 25 cm. 
<br/><br/><label>ISBN: </label>9783527310524 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics
<br/><br/><label>Dewey Class. No.: </label>530.4275  / BIR