विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
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Scanning electron microscopy and x-ray microanalysis [3rd ed.]

By:

Goldstein, Joseph …[et al.]

Material type: Text

Text

TextPublication details: Springer 2003Edition: 3rd edISBN:

9780306472923

Subject(s):

Physics

DDC classification:

502.825 GOL.3E

Average rating: 0.0 (0 votes)

Holdings ( 2 )

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Reference Books	LRC, IIT Indore 3rd Floor - Reference Collection	Reference	502.825 GOL.3E (Browse shelf(Opens below))	Not For Loan		8737
Book	LRC, IIT Indore 3rd Floor - General Stack		502.825 GOL.3E (Browse shelf(Opens below))	Checked out to Sourav Kumar (2201105009)	10/05/2024	8738

Total holds: 0

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Previous	502.825 Electron microscopy and analysis	502.825 BOW Scanning Tunneling Microscopy in Surface Science, Nanoscience and Catalysis	502.825 BOZ Electron Microscopy : Principles and Techniques for Biologists	502.825 GOL.3E Scanning electron microscopy and x-ray microanalysis [3rd ed.]	502.825 GOO.3E Electron microscopy and analysis [3rd ed.]	502.825 REI Transmission Electron Microscopy: Physics of Image Formation	502.825 REI Scanning electron microscopy : physics of image formation and microanalysis	Next

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