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Atomic force microscopy : understanding basic modes and advanced applications
Material type:
TextPublication details: Hoboken, New Jersey John Wiley and Sons 2012Description: xxii, 464p. ; 24 cmISBN: - 9780470638828
- 620.5 HAU
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Reference Books
|
LRC, IIT Indore 3rd Floor - Reference Collection | Reference | 620.5 HAU (Browse shelf(Opens below)) | Not For Loan | 24586 |
Total holds: 0
