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 संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
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Models in hardware testing : lecture notes of the forum in honor of Christian Landrault

By: Material type: TextTextSeries: Frontiers in electronic testing ; v. 43Publication details: New York Springer 2010Description: xiv, 257p. ; 24cmISBN:
  • 9789048132812
DDC classification:
  • 621.38215 WUN
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