विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

By:

Pavlov, Andrei

Contributor(s):

Sachdev, Manoj

Material type: Text

Text

TextPublication details: New Delhi Springer 2011Description: xvi, 193 p. ; 23.5 cmISBN:

9788132202325

Subject(s):

Computer sc. /Electrical engg

DDC classification:

621.38152 PAV

Average rating: 0.0 (0 votes)

Holdings ( 1 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Book	LRC, IIT Indore 2nd Floor - General Stack	621.38152 PAV (Browse shelf(Opens below))	Available		16048

Total holds: 0

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