विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
Learning Resource Center, Indian Institute of Technology Indore

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Thin film analysis by X-Ray scattering

Birkholz, Mario

Thin film analysis by X-Ray scattering - Weinheim WILEY-VCH 2006 - xxii, 356p. ; 25 cm.

ISBN: 9783527310524

Subjects--Topical Terms:
Physics

Dewey Class. No.: 530.4275 / BIR

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विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौरLearning Resource Center, Indian Institute of Technology Indore

ऑनलाइन सार्वजनिक अभिगम प्रसूचीOnline Public Access Catalogue (OPAC)

Thin film analysis by X-Ray scattering

विद्यार्जन संसाधन केंद्र, भारतीय प्रौद्योगिकी संस्थान इन्दौर
Learning Resource Center, Indian Institute of Technology Indore

ऑनलाइन सार्वजनिक अभिगम प्रसूची
Online Public Access Catalogue (OPAC)